TLP传输线脉冲测试系统是一款便携式脉冲IV-曲线特性表征系统，用于模拟静电放电脉冲事件，例如TLP，vf-TLP，HMM，HBM，EFT和低压浪涌。系统会检测脉冲期间皮秒或纳秒级的瞬态电压和电流波形，并测试脉冲前、后被测器件的状态（漏电流，击穿电压，偏置电流，静态IV曲线等），可测的DUT包括静电防护器件，半导体，电路模块，触摸板传感器等。

ES631-线缆ESD放电测试系统是一种综合型测试系统，用于模拟带电的以太网线向任意基于以太网的网络系统或设备放电时的影响。

TLP-1000 系列高压脉冲发生器是我们推出的一款传输线脉冲（TLP）发生器，输出电压可达5 kV。该发生器能够产生一个过冲小，平整度高的传输线脉冲，可直接注入被测器件（DUT），也可搭配不同的场探头产生电场或磁场进行辐射场测试。发生器通过前面板上的5英寸触摸屏或者后面板的串口进行电压极性、电压幅度以及输出脉冲频率的控制。发生器的脉冲宽度和上升沿可根据客户需求进行定制化设计。

ES62X-LVS Low Voltage Surge System is designed for testing the surge immunity of devices at both wafer and package levels.

ES640 Charged Device Model (CDM) Test System$nCharged Device Model (CDM) electrostatic discharge is a common cause of microelectronic circuit failure.

ES622 Series TLP Pulsed IV-Curve System is an advanced IV-curve characterization system designed to simulate ESD events (TLP/ VF-TLP/ HMM/ HBM/MM pulse) and monitor a device

ES612A ESD TESTER (HBM, HMM, MM) is a 2-Pin tester designed for the evaluation of devices at both wafer level and package level. The tester is designed to carry HBM, HMM and MM ESD standards.

TLP-1000A Series Transmission Line Pulse Generator is our latest design for standalone TLP pulses that can generate and inject direct TLP pulses, E field and H field to the device under test